发明名称 Method of processing residue of ion implanted photoresist, and method of producing semiconductor device
摘要 In order to carry out ashing at a high efficiency without leaving any residue and also to inhibit corrosion of an underlying material of a resist and further to prevent particle contamination, a photoresist is ashed at a low temperature to be removed and a residue of the photoresist is removed at a high temperature.
申请公布号 US6417080(B1) 申请公布日期 2002.07.09
申请号 US20000491876 申请日期 2000.01.27
申请人 CANON KABUSHIKI KAISHA 发明人 YOKOSHIMA SHIGENOBU
分类号 G03F7/42;H01L21/311;(IPC1-7):H01L21/306 主分类号 G03F7/42
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