发明名称 Void eliminating seed layer and conductor core integrated circuit interconnects
摘要 An integrated circuit and manufacturing method therefor is provided having a semiconductor substrate with a semiconductor device. A device dielectric layer is formed on the semiconductor substrate and a channel dielectric layer on the device dielectric layer has an opening formed therein. A barrier layer lines the channel opening and a conductor core fills the opening over the barrier layer. A seed layer is disposed between the barrier layer and the conductor core. The seed layer has an associated element which is formed during annealing into an intermetallic compound which has a density lower than the density of the conductor core.
申请公布号 US6417566(B1) 申请公布日期 2002.07.09
申请号 US20000705121 申请日期 2000.11.01
申请人 ADVANCED MICRO DEVICES, INC. 发明人 WANG PIN-CHIN CONNIE;MARATHE AMIT P.
分类号 H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L23/48 主分类号 H01L21/768
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