发明名称 Non-volatile semiconductor memory device and method for manufacturing the same
摘要 The present invention relates to a non-volatile semiconductor memory device, having the higher margin of the implanted ion passing through a source-to-drain electrode, as well as the excellent covering power of an embedded layer deposited in and above a groove within a field oxide region distributed at both the source-to-drain electrode and a source area.The present invention also provides a method for manufacturing the non-volatile semiconductor memory device.
申请公布号 US6417540(B1) 申请公布日期 2002.07.09
申请号 US20000630018 申请日期 2000.07.31
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SUGIHARA TSUYOSHI;SHIMIZU SATOSHI;ONAKADO TAKAHIRO
分类号 G11C16/04;H01L21/302;H01L21/3065;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 G11C16/04
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