发明名称 |
Non-volatile semiconductor memory device and method for manufacturing the same |
摘要 |
The present invention relates to a non-volatile semiconductor memory device, having the higher margin of the implanted ion passing through a source-to-drain electrode, as well as the excellent covering power of an embedded layer deposited in and above a groove within a field oxide region distributed at both the source-to-drain electrode and a source area.The present invention also provides a method for manufacturing the non-volatile semiconductor memory device.
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申请公布号 |
US6417540(B1) |
申请公布日期 |
2002.07.09 |
申请号 |
US20000630018 |
申请日期 |
2000.07.31 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
SUGIHARA TSUYOSHI;SHIMIZU SATOSHI;ONAKADO TAKAHIRO |
分类号 |
G11C16/04;H01L21/302;H01L21/3065;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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