发明名称 Method to improve silicide formation on polysilicon
摘要 A polysilicon layer of a gate structure is covered by a film that blocks introduction of implanted dopants into the polysilicon layer, while allowing implantation into the source and drain. The implant blocking film is removed before metal deposition for the salicide process.
申请公布号 US2002086485(A1) 申请公布日期 2002.07.04
申请号 US20010023825 申请日期 2001.12.19
申请人 KITTL JORGE ADRIAN;HONG QI-ZHONG 发明人 KITTL JORGE ADRIAN;HONG QI-ZHONG
分类号 H01L21/265;H01L21/3213;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/265
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