TEST CHAMBER UNIT FOR TESTING SEMICONDUCTOR DEVICE

摘要

A test chamber unit for testing a semiconductor device is provided to simplify a test process, eliminate a test delay time, and shorten a total test time by performing the test process without performing a sorting process. A test tray loading unit(10) is used for loading a plurality of test trays including semiconductor devices as test targets. A test unit performs a test process by connecting electrically the semiconductor devices of the test trays received from the test tray loading unit with a test socket of a test head. A test tray unloading unit(20) is used for receiving and loading the test trays of the tested semiconductor devices.