发明名称 |
SEMICONDUCTOR DEVICE INCLUDING DIFFUSION BARRIER AND METHOD FOR FORMING THE SAME |
摘要 |
PURPOSE: A semiconductor device including a diffusion barrier and a method for forming the same are provided to improve reliability of a transistor by preventing diffusion of ions from an inter-metal insulating layer to a gate insulating layer. CONSTITUTION: A gate oxide layer(110) and a gate poly(120) are formed on a semiconductor substrate(100). A spacer(130) is formed on both sidewalls of the gate oxide layer(110) and the gate poly(120). An interlayer dielectric(140) is formed on a whole surface of the semiconductor substrate(100). A diffusion barrier(150) is formed on the interlayer dielectric(140). An insulating layer(160) is formed on the diffusion barrier(150). A conductive layer(170) is formed on a part of the diffusion barrier(150). An inter-metal insulating layer(180) is formed on the whole surface of the diffusion barrier(150). The diffusion barrier(150) is used for preventing a diffusion process of the inter-metal insulating layer(180) to the gate oxide layer(110).
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申请公布号 |
KR20020052654(A) |
申请公布日期 |
2002.07.04 |
申请号 |
KR20000082065 |
申请日期 |
2000.12.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JANG, DONG YEOL;OH, JUN SEONG;SHIN, HWA SUK |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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