发明名称 SEMICONDUCTOR DEVICE INCLUDING DIFFUSION BARRIER AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: A semiconductor device including a diffusion barrier and a method for forming the same are provided to improve reliability of a transistor by preventing diffusion of ions from an inter-metal insulating layer to a gate insulating layer. CONSTITUTION: A gate oxide layer(110) and a gate poly(120) are formed on a semiconductor substrate(100). A spacer(130) is formed on both sidewalls of the gate oxide layer(110) and the gate poly(120). An interlayer dielectric(140) is formed on a whole surface of the semiconductor substrate(100). A diffusion barrier(150) is formed on the interlayer dielectric(140). An insulating layer(160) is formed on the diffusion barrier(150). A conductive layer(170) is formed on a part of the diffusion barrier(150). An inter-metal insulating layer(180) is formed on the whole surface of the diffusion barrier(150). The diffusion barrier(150) is used for preventing a diffusion process of the inter-metal insulating layer(180) to the gate oxide layer(110).
申请公布号 KR20020052654(A) 申请公布日期 2002.07.04
申请号 KR20000082065 申请日期 2000.12.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, DONG YEOL;OH, JUN SEONG;SHIN, HWA SUK
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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