发明名称 |
Measurement probe for detecting electrical signals in an integrated semiconductor circuit |
摘要 |
A measurement probe for detecting electrical signals in an integrated circuit on a semiconductor chip has a lever arm and a probe tip which is configured on the lever arm. The lever arm is made of a highly conductive material that is covered by an extremely thin insulator layer. The probe tip has a window in the insulator layer at the apex point, and the lever arm makes contact through the insulator layer. This measurement probe can be operated in a force mode and in a tunneling mode, in order to move to a measurement point on the integrated circuit with high positioning accuracy, and to detect the electrical signals at this measurement point.
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申请公布号 |
US2002084791(A1) |
申请公布日期 |
2002.07.04 |
申请号 |
US20010947295 |
申请日期 |
2001.09.05 |
申请人 |
KLEHN BERND;LINDOLF JUERGEN |
发明人 |
KLEHN BERND;LINDOLF JUERGEN |
分类号 |
G01R31/26;G01Q70/12;G01R1/06;G01R1/067;G01R1/073;H01L21/66;(IPC1-7):G01R31/302 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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