发明名称 |
Apparatus for layout designing of semiconductor device, method of layout designing, and semiconductor device |
摘要 |
A layout designing apparatus and a layout designing method that can improve the uniformity of the pattern density of a layout pattern in which dummy patterns are formed, and a semiconductor device manufactured using the layout designing method can be obtained. The layout designing method includes the steps of entering a plurality of circuit patterns of a semiconductor device; recognizing the positional data of the entered plurality of circuit patterns; producing a dummy pattern group including a plurality of dummy patterns, each of which being arranged per repetitive distance determined based on the recognized positional data of the circuit patterns; extracting a final dummy pattern including a dummy pattern located in a region not overlapping with the circuit patterns from the dummy pattern group; and outputting a layout pattern including the extracted final dummy pattern and the circuit patterns.
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申请公布号 |
US2002087942(A1) |
申请公布日期 |
2002.07.04 |
申请号 |
US20010900026 |
申请日期 |
2001.07.09 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KITADA OSAMU |
分类号 |
G06F17/50;H01L21/027;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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