| 摘要 |
PROBLEM TO BE SOLVED: To improve the compatibility of a socket for the solid-state image pickup device inspection with difference in a package type of a solid-state image pickup device 12, and to make it unnecessary to prepare different solid- state image pickup devices for respective package types and replace the socket for the solid-state image pickup device inspection when the package type of the solid-state image pickup device for inspection. SOLUTION: This socket for the solid-state image pickup device inspection has a plurality of pins 8 which are arranged so as to be brought into contact partially with respective leads 13 of both side surfaces of a solid-state image pickup device 12, and lead out electrically the respective leads 13 of the solid- state image pickup device 12; and a lever 13 which is operated to separate the plurality of pins 8 brought into contact with the leads 13 arranged, for instance, on both the side surfaces of the solid-state image pickup device 12, from the respective leads 13 of the solid-state image pickup device 12. |
