发明名称 SOLID-STATE IMAGE PICKUP ELEMENT AND IMAGING PICKUP DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an imaging device that can perform photometry at a high-speed with high accuracy. SOLUTION: A photometry element to measure the light quantity of an incident light L1 is place to a desired pixel among pixels placed on an image pickup face of a solid-state image pickup element 2, the luminous quantity of the incident light L1 made incident onto the solid-state image pickup element 2 is discriminated on the basis of luminance information S2 obtained from other pixels than the pixel to which the photometry element is placed among the pixels and information S3 obtained from the photometry element, the exposure is controlled, depending on the result of discrimination to extend the dynamic range of the solid-state image pickup element 2 so as to avoid repetitive photometry measurement thereby performing photometry at a high-speed with high accuracy.
申请公布号 JP2002185869(A) 申请公布日期 2002.06.28
申请号 JP20000382901 申请日期 2000.12.15
申请人 SONY CORP 发明人 AKAGI EIICHI
分类号 H01L27/148;H04N5/335;H04N5/353;H04N5/355;H04N5/359;H04N5/369;H04N5/372;H04N5/378;(IPC1-7):H04N5/335 主分类号 H01L27/148
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