TESTING DEVICE FOR CONNECTING STRUCTURE OF SECONDARY CELL, AND TESTING METHOD FOR THE SAME

摘要

PROBLEM TO BE SOLVED: To accurately easily test the joined state of a connecting structure used as an electrode group of a sealed secondary cell at each junction. SOLUTION: A connecting structure 10 is irradiated from one side by a light emission part 4 so that a testing light passes through both sides of respective electrode plates 11 of the connecting structure 10 of which, the plurality of electrode plates 11 are vertically jointed to a current collection plate 12. The joining strength of respective fillets 14 are quantitatively estimated by measuring the height of respective fillets 14 or the like depending on the image of respective fillets 14 obtained by receiving the testing light at a light receiving part 5 installed at the other side of the connecting structure 10.