| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method for simulating noise in which the noise characteristics of a device can be predicted with high accuracy in a short time. SOLUTION: The method for simulating noise of a device utilizing the motion of charged particles comprises a step for setting a space distribution including at least the shape, a discrete lattice point for numerical calculation and charged particle distribution of the device to be analyzed by receiving the structure and noise analysis instruction of the device, a step executing steady simulation for analyzing the physical quantity distribution under steady state of the device, a step executing a transient simulation for determining the time response of physical quantity at each position in the device by introducing a time variant noise source for the device, a step for determining the frequency spectrum component of variation in the physical quantity from the time response of physical quantity at each position, and a step for determining noise at a specified observation point of the device by small signal analysis using a frequency spectrum component thus obtained as an AC power supply.</p> |
