发明名称 |
METHOD FOR FORMING CONTACT PLUG USING BARRIER METAL |
摘要 |
PURPOSE: A formation method of a contact plug is provided to reduce a manufacturing cost and to improve a through-put by forming a titanium nitride as a barrier metal by only a thermal treatment of a titanium at a nitrogen gas or an ammonia gas atmosphere without an extra titanium nitride formation. CONSTITUTION: An insulating layer(220) is formed on a semiconductor substrate(200) having an active region(210). An insulating pattern having a contact hole(230) is formed by partially etching the insulating layer(220) to expose the active region(210). A titanium(240) having a defined thickness is formed on the resultant structure. By annealing the titanium(240) at N2 or NH3 gas atmosphere, a titanium silicide layer(240a) on the active region(210) and a titanium nitride(240b) as a barrier metal on the titanium(240) are simultaneously formed, thereby simplifying a contact plug formation processing.
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申请公布号 |
KR20020051151(A) |
申请公布日期 |
2002.06.28 |
申请号 |
KR20000080687 |
申请日期 |
2000.12.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, EUNG YONG;CHO, IN SU;CHOI, YEONG GWON |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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