发明名称 |
METHOD FOR MANUFACTURING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A fabrication method of metal interconnections is provided to easily achieve a filling of contact holes having a high aspect ratio and to prevent a spiking of junctions. CONSTITUTION: An interlayer dielectric(23) is formed on a semiconductor substrate(21) having a lower metal wire(22). A contact hole is formed by selectively etching the interlayer dielectric. A barrier metal(24a) is formed on the contact hole. The contact hole is easily filled by selectively growing a metal interconnection(25). Then, an upper metal wire is formed to electrically connect to the lower metal wire(22) via the metal interconnection(25).
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申请公布号 |
KR20020051169(A) |
申请公布日期 |
2002.06.28 |
申请号 |
KR20000080718 |
申请日期 |
2000.12.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JEONG JU;LEE, WON JUN |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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