发明名称 METHOD FOR MANUFACTURING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A fabrication method of metal interconnections is provided to easily achieve a filling of contact holes having a high aspect ratio and to prevent a spiking of junctions. CONSTITUTION: An interlayer dielectric(23) is formed on a semiconductor substrate(21) having a lower metal wire(22). A contact hole is formed by selectively etching the interlayer dielectric. A barrier metal(24a) is formed on the contact hole. The contact hole is easily filled by selectively growing a metal interconnection(25). Then, an upper metal wire is formed to electrically connect to the lower metal wire(22) via the metal interconnection(25).
申请公布号 KR20020051169(A) 申请公布日期 2002.06.28
申请号 KR20000080718 申请日期 2000.12.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JEONG JU;LEE, WON JUN
分类号 H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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