发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method for a semiconductor device which is integrated and micronized while a withstand voltage for separation is kept high in an LOCOS separation region. SOLUTION: The manufacturing method for a semiconductor device is provided wherein a source/drain region is formed on a silicon substrate separated by an LOCOS separation region by ion implantation. A mask forming process in which an implantation mask is formed on the LOCOS separation region is included, where the implantation mask is so formed that no ion implanted in an ion implanting process reaches the silicon substrate below the LOCOS separation region after passing through it.
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申请公布号 |
JP2002184866(A) |
申请公布日期 |
2002.06.28 |
申请号 |
JP20000382010 |
申请日期 |
2000.12.15 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
SHIROMOTO TATSUYA;SHIMIZU SATORU |
分类号 |
H01L21/8247;H01L21/762;H01L21/8234;H01L27/08;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/823;H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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