发明名称 3D SHAPE MEASURING SYSTEM USING PROJECTION
摘要 A transfer type three-dimensional shape measuring system is provided to measure the shape at high speed without being affected by affected by the external disturbance and vibration. A transfer type three-dimensional shape measuring system comprises a pattern transfer unit(100) which is rotatable around the location in which a measurement object(300) is arranged, and an imaging unit(200) including an imaging lens(210) and an image acquisition part(220). The pattern transfer unit includes a pattern forming part(110) generating pattern light of sine-wave shape. The imaging lens receives the light which is emitted from the pattern transfer unit and reflected from the measurement object, and the image acquisition part obtains image from the light coming in through the imaging lens.
申请公布号 KR20090010350(A) 申请公布日期 2009.01.30
申请号 KR20070073391 申请日期 2007.07.23
申请人 NANO SYSTEM CO., LTD. 发明人 LEE, HYUNG SEOK
分类号 G01B11/25;G01B11/24 主分类号 G01B11/25
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