SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE IDENTIFYING METHOD, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE PRODUCING METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

A semiconductor integrated circuit device identifying method, wherein a plurality of identifying elements having the same form are formed in the process of production of semiconductor integrated circuit devices, the identifying elements being used as identifying information intrinsic in the semiconductor integrated circuit devices on the basis of the magnitude relation between physical values corresponding to process variations in the plurality of identifying elements.