| 摘要 |
An object is to enable the reference level to be generated without the use of a dummy cell in a ferroelectric memory device having a single-transistor, single-capacitor memory cell structure. To achieve this object, a P-type MOS transistor is additionally connected between two nodes which are control terminals of a sense amplifier, and an offset is generated in the sense amplifier. To one of the nodes, a sense amplifier control signal is directly input, and to the other node, the sense amplifier control signal is input through the P-type MOS transistor. The offset level of the sense amplifier is set by setting the potential of the offset control signal which is the gate input of the P-type MOS transistor. Consequently, the reference level can be generated without the use of a dummy cell. As a result, a high-speed, high-reliability ferroelectric memory device can be provided.
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