发明名称 Lithography mask configuration
摘要 A reflective membrane mask is composed at least partially of an electrically conductive material and is aligned horizontally over a sample to be processed. Bending of the reflective membrane mask is compensated for by disposing an electrode plate above the membrane mask and parallel to it, which electrode plate is provided with a number of electrodes that are electrically isolated from one another. Electrostatic forces, that correct for any deformation of the membrane mask, are produced by applying an electrical potential difference between each electrode and the membrane mask.
申请公布号 US2002081498(A1) 申请公布日期 2002.06.27
申请号 US20010982200 申请日期 2001.10.17
申请人 EHRMANN ALBRECHT 发明人 EHRMANN ALBRECHT
分类号 G03F1/00;G03F1/14;G03F1/24;G03F7/20;(IPC1-7):G03B27/42;G21K5/00;G03F9/00;G02F1/134 主分类号 G03F1/00
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