发明名称 |
Semiconductor integrated circuit device and manufacturing method thereof |
摘要 |
In the semiconductor integrated circuit device, two epitaxial layers and are formed on a substrate, and they are electrically isolated by a P+ type isolating region into three island regions. A diode element is formed in the first island region, and an N+ type well region is formed in an overlapping relationship with an N+ type cathode lead region. Since this reduces the resistance of an N-type region at a PN junction to reduce a forward voltage VBEF, a forward current (If) capacity can be significantly improved.
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申请公布号 |
US2002079555(A1) |
申请公布日期 |
2002.06.27 |
申请号 |
US20010032236 |
申请日期 |
2001.12.21 |
申请人 |
OKAWA SHIGEAKI;OHKODA TOSHIYUKI |
发明人 |
OKAWA SHIGEAKI;OHKODA TOSHIYUKI |
分类号 |
H01L21/331;H01L21/8222;H01L21/8228;H01L27/06;H01L29/08;H01L29/732;H01L29/861;(IPC1-7):H01L29/70;H01L27/102;H01L27/082;H01L31/11 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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