发明名称 Semiconductor integrated circuit device and manufacturing method thereof
摘要 In the semiconductor integrated circuit device, two epitaxial layers and are formed on a substrate, and they are electrically isolated by a P+ type isolating region into three island regions. A diode element is formed in the first island region, and an N+ type well region is formed in an overlapping relationship with an N+ type cathode lead region. Since this reduces the resistance of an N-type region at a PN junction to reduce a forward voltage VBEF, a forward current (If) capacity can be significantly improved.
申请公布号 US2002079555(A1) 申请公布日期 2002.06.27
申请号 US20010032236 申请日期 2001.12.21
申请人 OKAWA SHIGEAKI;OHKODA TOSHIYUKI 发明人 OKAWA SHIGEAKI;OHKODA TOSHIYUKI
分类号 H01L21/331;H01L21/8222;H01L21/8228;H01L27/06;H01L29/08;H01L29/732;H01L29/861;(IPC1-7):H01L29/70;H01L27/102;H01L27/082;H01L31/11 主分类号 H01L21/331
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