发明名称 |
CONTROLLED ANNEAL CONDUCTORS FOR INTEGRATED CIRCUIT INTERCONNECTS |
摘要 |
A method is provided for manufacturing an integrated circuit on a semiconductor wafer (200) having a semiconductor substrate with a semiconductor device thereon. A dielectric layer is formed on the semiconductor substrate and an opening is formed in the dielectric layer. A barrier (226, 232) layer is deposited to line the opening. A seed layer (228, 234) is deposited on the barrier layer and securely bonds to the barrier layer. A conductor (230, 236) layer is deposited to fill the channel opening over the barrier layer. A planarization technique is used to planarize the barrier, seed layer, and conductor layers to be coplanar with the dielectric layer to form a conductor channel. The semiconductor wafer is then subjected to a two step timed anneal. |
申请公布号 |
WO0250895(A2) |
申请公布日期 |
2002.06.27 |
申请号 |
WO2001US50969 |
申请日期 |
2001.10.23 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
AVANZINO, STEVEN, C.;WANG, PIN-CHIN, CONNIE;NGO, MINH, VAN |
分类号 |
H01L21/288;H01L21/768 |
主分类号 |
H01L21/288 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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