发明名称 CONTROLLED ANNEAL CONDUCTORS FOR INTEGRATED CIRCUIT INTERCONNECTS
摘要 A method is provided for manufacturing an integrated circuit on a semiconductor wafer (200) having a semiconductor substrate with a semiconductor device thereon. A dielectric layer is formed on the semiconductor substrate and an opening is formed in the dielectric layer. A barrier (226, 232) layer is deposited to line the opening. A seed layer (228, 234) is deposited on the barrier layer and securely bonds to the barrier layer. A conductor (230, 236) layer is deposited to fill the channel opening over the barrier layer. A planarization technique is used to planarize the barrier, seed layer, and conductor layers to be coplanar with the dielectric layer to form a conductor channel. The semiconductor wafer is then subjected to a two step timed anneal.
申请公布号 WO0250895(A2) 申请公布日期 2002.06.27
申请号 WO2001US50969 申请日期 2001.10.23
申请人 ADVANCED MICRO DEVICES, INC. 发明人 AVANZINO, STEVEN, C.;WANG, PIN-CHIN, CONNIE;NGO, MINH, VAN
分类号 H01L21/288;H01L21/768 主分类号 H01L21/288
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