| 摘要 |
PURPOSE: A test pin unit is provided to achieve an improved test efficiency of test equipment by significantly reducing the test pin unit transfer frequency. CONSTITUTION: A test pin unit(5) comprises a body(50), a movable body(51), a first movement control unit, and a second movement control unit. The body(50) is mounted to a moving board which moves in a horizontal direction of a printed circuit board, and which moves in a vertical direction along the moving board. The movable body(51) is mounted to the body to be movable in a horizontal direction, and which has sliding surfaces(50a,50b) arranged at the front end of the movable body such that the sliding surfaces are disposed in a vertical direction of the printed circuit board, wherein the sliding surfaces have a plurality of magnets(503) buried into the sliding surface. The first movement control unit controls the horizontal movement of the movable body with respect to the body. The moving element(52) is attached to the sliding surfaces of the movable body, and which slides toward the printed circuit board such that a test pin(520) arranged at the front end of the moving element contacts a contact point of the printed circuit board and the test pin applies an electrical signal to the contact point of the printed circuit board. The second movement control unit for forcing the moving element to slide.
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