发明名称 THIN PLATE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a thin plate inspection device capable of feeding a thin plate without damaging the same, capable of easily correcting angular shift and capable of easily corresponding to a size change. SOLUTION: In the thin plate inspection device for feeding the thin plate 4 such as a liquid crystal substrate or the like to the inspection station 3 on a surface plate 2 to inspect the same, a thin plate transfer means 6 for grasping the front end 5 of the thin plate 4 to transfer the same on the surface plate 2, air sliders 7 provided on the surface plate 2 before and behind the inspection station 3 and floating the transferred thin plate 4 by air, and air bearings 8 provided to the inspection station 3 and performing the blowing and sucking of air with respect to the thin plate 4 at the same time to adjust the floating height of the thin plate 4, are provided.
申请公布号 JP2002181714(A) 申请公布日期 2002.06.26
申请号 JP20000385118 申请日期 2000.12.19
申请人 ISHIKAWAJIMA HARIMA HEAVY IND CO LTD 发明人 FUJIWARA TATSUO;HIROSE HIROKI;NAKAMURA TOSHIO;SHIODA TOMOHIKO
分类号 G01N21/84;B65G51/03;G01N21/958;(IPC1-7):G01N21/84 主分类号 G01N21/84
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