发明名称 DEVICE AND METHOD FOR INSPECTING PHOTODETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a device and a method for inspecting a photodetector achieving the improvement of accuracy and stability of the inspection and capable of providing a photodetector having high reliability. SOLUTION: The device for inspecting the photodetector, which includes at least one light-receiving surface and outputs a photodetecting signal depending on a light irradiation level to the light-receiving surface, comprises light irradiation means (11, 12, 13, 14a, 14b) for irradiating the receiving-surface of the photodetector with an inspection light of a predetermined level and scanning the inspection light on the light-receiving surface, and an image-processing section 24 for creating image data for detecting a defect of the photodetector based on the photodetecting signal having the level depending on the presence or absence of the defect of the light-receiving surface at the scanning of the inspection light on the light-receiving surface.
申请公布号 JP2002181658(A) 申请公布日期 2002.06.26
申请号 JP20000378079 申请日期 2000.12.12
申请人 SONY CORP 发明人 YAMAGATA OSAMU;SHIBA TAKAKANE
分类号 G01M11/00;G11B7/22;H01L21/66;H01L31/02;H01L31/10;(IPC1-7):G01M11/00 主分类号 G01M11/00
代理机构 代理人
主权项
地址