发明名称 |
Method of manufacturing semiconductor wafers |
摘要 |
<p>According to the invention, the flatness and quality can be improved while simplifying the process even when large size wafers of 200 to 300 mm or above are processed. Basic steps involved are a slicing step E for obtaining thin disc-shaped wafers by slicing, a chamfering step F for chamfering the sliced wafers, a flattening step G for flattening the chamfered wafers, an alkali etching step H for removing process damage layers from the flattened wafers, and a double-side polishing step K of simultaneously polishing the two sides of the etched wafers. A plasma etching step P is used in lieu of the flattening and etching steps G and H respectively, or in addition to them. <IMAGE></p> |
申请公布号 |
EP1217104(A2) |
申请公布日期 |
2002.06.26 |
申请号 |
EP20020003046 |
申请日期 |
1997.03.25 |
申请人 |
SHIN-ETSU HANDOTAI CO., LTD. |
发明人 |
KATO, TADAHIRO;MASUMURA, HISASHI;OKUNI, SADAYUKI;KUDO, HIDEO |
分类号 |
B24B1/00;C30B33/00;H01L21/00;H01L21/302;H01L21/304;H01L21/306;(IPC1-7):C30B33/00 |
主分类号 |
B24B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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