摘要 |
PROBLEM TO BE SOLVED: To provide a spectral reflectance measuring apparatus and method capable of measuring the reflectance of light with a specific wavelength, over a wide wavelength range including the ultraviolet range, and easily obtaining a reference value. SOLUTION: The spectral reflectance measuring apparatus comprises a light source part having a xenon lamp, an incoming fiber, a measuring head for applying light from the incoming fiber to a surface to be measured via a positive lens and a light diffusion panel and for receiving the light reflected from the surface, an outgoing fiber, and a spectroradiometer receiving the light from the outgoing fiber. The measuring head includes an incoming tube part and an ongoing tube part which is independent of the incoming tube part, with the incoming and ongoing tube parts being separably and integrally connected to each other while their respective optical axes intersect at or near the surface to be measured. Further, the incoming and ongoing tube parts can be connected to each other while their optical axes are coincident.
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