| 摘要 |
PROBLEM TO BE SOLVED: To shorten a time required for measurement of an IC. SOLUTION: This handler 7 is provided with a contact part 2 mounted thereon with the measured IC, a defective-storing tray 4 for storing the defective IC, a non-defective storing tray 5 for storing a non-defective IC, a conveying arm 8 for conveying the IC, a memory 11 for storing position information and measured information of the stored IC to be correlated, and a control part 13. The control part 13 reads the measured information and the position information of the IC from the memory 11, to specify the IC corresponding to an input condition and to specify a storage position, the specified IC is conveyed by the arm 8 to be mounted on the contact part 2, and a retest is conducted by a tester 1. The retested IC is classifiedly conveyed to the defective storing tray 4 or the non-defective storing tray 5 by the conveying arm 8.
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