发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to increase a contact area between an upper plug and a lower plug by making the upper portion of the lower plug have a round type, and to improve reliability of an interconnection by reducing a stack error and a void. CONSTITUTION: The first interlayer dielectric(22) is formed on a semiconductor substrate(21). The first interlayer dielectric is selectively removed to expose a predetermined region of the semiconductor substrate so that the first contact hole is formed. The first contact hole is filled with a conductive material to form the first plug(23). The second interlayer dielectric(24) is deposited on the semiconductor substrate. The second interlayer dielectric is selectively eliminated to expose the first plug so that the second contact hole is formed. The upper portion of the exposed first plug is rounded. The second contact hole is filled with a conductive material to form the second plug(27).
申请公布号 KR20020049858(A) 申请公布日期 2002.06.26
申请号 KR20000079166 申请日期 2000.12.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 RYU, SANG UK;YOON, JUN HO
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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