发明名称 METHOD FOR MEASURING MEMBRANE THICKNESS OF ELECTROPHOTOGRAPH PHOTOCONDUCTOR SURFACE LAYER AND EVALUATING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a membrane thickness measuring method capable of measuring the membrane thickness of a surface layer in which a filler is dispersed without being affected by the scattering of light and opaqueness in the surface layer in the method for measuring the membrane thickness of the surface layer in which the filler is dispersed in an electrophotograph photoconductor and a membrane evaluating method capable of measuring changes in the percentage content of the filler in the surface layer in which the filler is dispersed. SOLUTION: Thermally exciting light intermittently modulated at a predetermined period determined by a membrane thermal property value is made incident onto the surface of the surface layer of the electrophotograph photoconductor with the surface layer in which the filler is dispersed. Then by detecting generated acoustic waves, the membrane thickness of the surface layer is measured.
申请公布号 JP2002181521(A) 申请公布日期 2002.06.26
申请号 JP20000384459 申请日期 2000.12.18
申请人 RICOH CO LTD 发明人 TOMOTA MITSUHIRO
分类号 G01B17/02;G01N21/00;G03G5/147;G03G21/00;(IPC1-7):G01B17/02 主分类号 G01B17/02
代理机构 代理人
主权项
地址