| 摘要 |
PROBLEM TO BE SOLVED: To normally and stably conduct a reliability evaluation test. SOLUTION: This testing device 10 is constituted of a cuboidal casing 11, and a semiconductor device attaching jig 12 provided in an upper face of the casing 11. The casing 11 is made of conductive metal, and is grounded in a proper portion, for example, in a bottom part. The attaching jig 12 is insulated electrically from the casing 11.
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