发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
Provided are a semiconductor device and a method for fabricating the same. The semiconductor device includes an active fin which protrudes from a substrate and is extended in a direction, a first device isolation layer which is extended from a side of the active fin to intersect with the active fin, a normal gate which is extended from the active fin to intersect with the active fin, a first dummy gate which is extended in parallel to the first device isolation layer on the first device isolation layer and has an undercut on a lower part thereof, and a first filler which is formed on the first device isolation layer and is filled in the undercut of the first dummy gate. So, the reliability of products can be improved. |
申请公布号 |
KR20160077989(A) |
申请公布日期 |
2016.07.04 |
申请号 |
KR20140188584 |
申请日期 |
2014.12.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOU, JUNG GUN;PARK, YOUNG JOON;HA, JI YONG |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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