发明名称 Method of producing MOS transistor
摘要 The surface of a silicon substrate is sputter-etched so that silicon clusters sputtered out form a silicon film on a side wall spacer. Then, a metal film of cobalt, titanium or the like is built up on the entire surface. Thereafter, silicidizing process is carried out to form metal silicide layers on a diffusion layer and the side wall spacer. Then, an inter-layer insulation film 14 is formed and is photo-etched to provide the inter-layer insulation film with a contact hole 15 overlapping the side wall spacer.
申请公布号 US6410392(B1) 申请公布日期 2002.06.25
申请号 US20010874111 申请日期 2001.06.06
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SOGO YASUNORI
分类号 H01L21/28;H01L21/263;H01L21/285;H01L21/3205;H01L21/336;H01L21/768;H01L29/417;H01L29/78;(IPC1-7):H01L21/336;H01L21/320;H01L21/476 主分类号 H01L21/28
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