发明名称 Capacitor for a semiconductor device
摘要 A semiconductor device comprises a substrate such as a semiconductor wafer having a major surface, a first conductive layer formed over the major surface, and a second conductive layer formed over the first conductive layer with the first and second conductive layers having a capacitance therebetween. A semiconductor layer is formed over the first and second conductive layer, the semiconductor layer having a diffusion region such as a transistor source, drain, and/or channel. An inventive method for forming the inventive structure comprises the steps of forming a first conductive layer over a substrate and forming a second conductive layer over the first conductive layer. Next, a semiconductor layer is formed over the second conductive layer and a transistor diffusion region, such as a source, drain, and/or channel is formed in the semiconductor layer.
申请公布号 US6410370(B1) 申请公布日期 2002.06.25
申请号 US20000618208 申请日期 2000.07.18
申请人 MICRON TECHNOLOGY, INC. 发明人 GRASS ANTHONY
分类号 H01L23/522;H01L23/64;H01L27/06;H01L27/08;H01L29/417;H01L29/92;(IPC1-7):H01L21/00 主分类号 H01L23/522
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