发明名称 Rigid polishing pad conditioner for chemical mechanical polishing tool
摘要 The present invention is a method and apparatus for conditioning a polishing pad used for chemically mechanically polishing semiconductor wafers. The conditioning device includes a rigid elongated element that resists bowing or warping during the conditioning process. Abrasive elements are supported by a substantially planar bottom surface of the rigid element. The abrasive elements may have a diamond layer cut into a grid pattern to provide an abrasive surface. The conditioning device is preferably used to condition a polishing pad supported by a rigid platen. The conditioning device is pressed against and swept across the polishing pad by an actuator while the polishing pad is rotated to uniformly condition the polishing pad. This uniform conditioning, while avoiding the bowing and warping of the prior art, provides a superior conditioning process for the polishing pad.
申请公布号 US6409580(B1) 申请公布日期 2002.06.25
申请号 US20010817554 申请日期 2001.03.26
申请人 SPEEDFAM-IPEC CORPORATION 发明人 LOUGHER WAYNE;DYER TIMOTHY S.
分类号 B24B37/04;B24B53/007;(IPC1-7):B24B1/00 主分类号 B24B37/04
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