发明名称 Low energy plasma cleaning method for cryofilms
摘要 Cryofilm/organic contaminants are removed from cryogenically cooled surfaces such as spacecraft cryo-telescope mirrors by sputtering and chemical reaction with a low energy plasma having an average ion energy of not more than about 30 eV, and preferably in the approximate range of 5-20 eV. When the reactive plasma's freezing point is higher than the temperature of the surface to be cleaned, the cryofilm and embedded hydrocarbons are first removed with a non-reactive plasma having a freezing point less than the surface temperature, the reactive plasma is then used to remove residual organic contaminants left on the surface by chemical reaction, and finally another inert plasma is applied to remove reactive plasma frozen to the surface; the two inert plasmas are preferably formed from the same gas.
申请公布号 US6409891(B1) 申请公布日期 2002.06.25
申请号 US19940236780 申请日期 1994.04.29
申请人 HUGHES ELECTRONICS CORPORATION 发明人 LIPPEY BARRET;GLEICHAUF DARRELL A.;WILLIAMSON WELDON S.
分类号 H05H1/24;B64G1/66;C23F4/00;C23G5/00;G02B5/08;G02B23/00;G02B27/00;(IPC1-7):C23C14/34;B08B7/00 主分类号 H05H1/24
代理机构 代理人
主权项
地址