发明名称 Apparatus for measuring contamination of the surface of a machine surface
摘要 A surface contamination measuring apparatus has a suction means for sucking in air from the proximity of an object under measurement, a measurement section for measuring the amount and composition of sucked-in particles, a discharging means for discharging a fluid onto the surface of the object under measurement, a sampling member brought into proximity to surface of the object under measurement, and a blocking member made of a flexible member at the periphery of the sampling member, and can efficiently capture particles that has become attached to the surface under measurement.
申请公布号 US6408701(B1) 申请公布日期 2002.06.25
申请号 US20000567642 申请日期 2000.05.09
申请人 NEC CORPORATION 发明人 FUJITA IKUHIRO
分类号 G01N15/14;G01N1/00;G01N1/02;G01N1/22;G01N15/06;G01N19/06;(IPC1-7):G01N1/04 主分类号 G01N15/14
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