REFRACTIVE INDEX PROFILE MEASUREMENT METHOD OF SMALL SIZE OPTICAL COMPONENT MANUFACTURING WITH THE INJECTION MOLDING

摘要

The present invention relates to a reflective index distribution measuring method for an emission small optical component without advance information on a thickness. According to the present invention, the reflective index distribution measuring method for an emission small optical component includes: a first optical path difference obtaining step of injecting a first liquid having a different reflective index from a sample into a sample insertion container in which there is a sample which is an emission small optical component to be tested, and obtaining first optical path differences which are optical path differences on different positions from an optical axis optical path by radiating the light; a second optical path difference obtaining step of removing the first liquid from the sample insertion container, placing a second liquid with the different reflective index from the firsts liquid and the sample after washing the sample insertion container, and obtaining second optical path differences which are the optical path difference on other positions about the optical axis optical path by radiating the light; and a reflective index distribution detecting step of detecting the distribution of the reflective index using the first optical path difference and the second optical path difference. In the reflective index distribution detecting step of the sample, the distribution of the reflective index in the sample is n_s(x,y)=OPD2(x,y)n_(r1)(x,y)-OPD1(x,y)n_(r2)(x,y)/OPD2(x,y)-OPD1(x,y). ( n_s(x,y) is the distribution of the reflective index in the sample.) OPD1(x,y) is the first optical path difference, and OPD2(x,y) is the second optical path difference. n_r1(x,y) is the reflective index of the first liquid, and the n_r2(x,y) is the reflective index of the second liquid.