Method for forming a metal capacitor in a damascene process

摘要

A method for forming a metal capacitor in a damascene process is provided. Before the metal capacitor is formed, the underlying interconnections are fabricated with Cu metal by damascene processes. The capacitor is formed by depositing a first metal layer, an insulator and a second metal layer. The stacked layers are then subjected to a masking process and an etching process to form the thin-film capacitor and the metal wire with the remaining insulator and the remaining second metal layer thereon. The remaining second metal layer located on the metal wire is removed by another masking process and another etching process. After forming the capacitor and the metal wire, the upper interconnections are fabricated with Cu metal by damascene processes.