发明名称 Vacuum processing apparatus and ion pump capable of suppressing leakage of ions and electrons from ion pump
摘要 A vacuum processing apparatus performs processing such-as a pattern depiction with a charged beam within a process chamber evacuated to a high vacuum by an ion pump. The vacuum processing apparatus, which makes it possible to prevent the accuracy of the charged beam pattern depiction from being deteriorated by ions and electrons leaking from the ion pump, has a conductor and a voltage applying unit. The conductor is arranged in the vicinity of the suction port of the process chamber communicating with the ion pump such that the conductor is electrically insulated from the process chamber. The voltage applying unit imparts a potential differing from that of the process chamber to the conductor. Because of the potential difference between the conductor and the process chamber, the ions and electrons leaking from the ion pump are reflected or adsorbed by the conductor so as to suppress leakage of the ions and electrons into the process chamber.
申请公布号 US6411023(B1) 申请公布日期 2002.06.25
申请号 US20000496643 申请日期 2000.02.03
申请人 TOSHIBA MACHINE CO., LTD. 发明人 OGURA KATSUHITO;HIRANO RYOICHI;TOJO TORU
分类号 G03F7/20;H01J37/18;H01J37/305;H01J41/12;H01L21/027;(IPC1-7):H05H19/00 主分类号 G03F7/20
代理机构 代理人
主权项
地址