发明名称 POLISHING PAD
摘要 PROBLEM TO BE SOLVED: To provide a polishing pad having a small global level difference, hardly causing dishing in a metal wire, and scarcely causing dust and clutch in the polishing pad mechanically flattening the surface of an insulating layer or the metal wire formed on a silicon substrate. SOLUTION: This polishing pad is characterized in that the micro rubber A hardness is 80 deg. or more, a tensile storage elasticity modulus of frequency 10 Hz under the temperature 120 deg.C is not less than 40 MPa and not more than 500 MPa, and a loss tangent, or the ratio of the tensile storage elasticity modulus to the tensile loss elasticity modulus, is 0.12 or more.
申请公布号 JP2002178255(A) 申请公布日期 2002.06.25
申请号 JP20000380053 申请日期 2000.12.14
申请人 TORAY IND INC 发明人 JIYOU KUNITAKA;OTA MASAMI;HASHISAKA KAZUHIKO
分类号 B24B37/20;B24B37/24 主分类号 B24B37/20
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