发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to prevent a void inside a lower electrode, by making a grain growth inside the lower electrode from being controlled by a sacrificial layer such that the grain growth is generated in a heat treatment process. CONSTITUTION: An insulation layer is formed on a semiconductor substrate(1) having a predetermined structure. A predetermined region of the insulation layer is etched to form a contact hole exposing a predetermined region of the semiconductor substrate. A contact plug(6) is formed to fill the contact hole. A lower electrode(8) is formed on the contact plug. After the sacrificial layer is formed on the lower electrode, a heat treatment process is performed. The sacrificial layer is removed, and a dielectric layer(10) is formed on the resultant structure including the lower electrode. An upper electrode is formed on the resultant structure including the dielectric layer.
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申请公布号 |
KR20020047519(A) |
申请公布日期 |
2002.06.22 |
申请号 |
KR20000075981 |
申请日期 |
2000.12.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, JONG BEOM;SONG, CHANG ROK |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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