发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to prevent a void inside a lower electrode, by making a grain growth inside the lower electrode from being controlled by a sacrificial layer such that the grain growth is generated in a heat treatment process. CONSTITUTION: An insulation layer is formed on a semiconductor substrate(1) having a predetermined structure. A predetermined region of the insulation layer is etched to form a contact hole exposing a predetermined region of the semiconductor substrate. A contact plug(6) is formed to fill the contact hole. A lower electrode(8) is formed on the contact plug. After the sacrificial layer is formed on the lower electrode, a heat treatment process is performed. The sacrificial layer is removed, and a dielectric layer(10) is formed on the resultant structure including the lower electrode. An upper electrode is formed on the resultant structure including the dielectric layer.
申请公布号 KR20020047519(A) 申请公布日期 2002.06.22
申请号 KR20000075981 申请日期 2000.12.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, JONG BEOM;SONG, CHANG ROK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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