发明名称 |
SCAN MOTOR INTERLOCK STRUCTURE OF ION IMPLANTER |
摘要 |
PURPOSE: A scan motor interlock of an ion implanter is provided to reduce a partial implanting problem occurring in a motor fail by improving its structure. CONSTITUTION: A scan motor interlock of an ion implanter comprises a scan motor(2) for supplying a motive power so as to move a wafer to a defined direction, a scan motor interface part(21) for supplying an electric source to the scan motor(2) and for receiving a level value of an output current when driving the scan motor(2), a monitoring part(11) for controlling a scan motor(2) through the scan motor interface part(21), for setting up an interlock when occurring a malfunction after comparing the level value of the output current supplied from the scan motor interface part(21) with a reference value previously installed and for displaying an error signal through a display device, thereby preventing an implanting problem.
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申请公布号 |
KR20020047471(A) |
申请公布日期 |
2002.06.22 |
申请号 |
KR20000075900 |
申请日期 |
2000.12.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SEONG JU;LEE, SEOK JUN |
分类号 |
H01L21/26;(IPC1-7):H01L21/26 |
主分类号 |
H01L21/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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