发明名称 ELECTRON RAY OR X-RAY RESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a positive electron ray or X-ray resist composition exhibiting high sensitivity and high resolution, capable of giving excellent rectangular pattern profile and having excellent PCD and PED stability and coating property. SOLUTION: The positive electron ray or X-ray resist composition contains a compound (a1) generating an acid by electron ray or X-ray irradiation and a nitrogen-containing compound (b) having at least a specific partial structure in the molecule.
申请公布号 JP2002174904(A) 申请公布日期 2002.06.21
申请号 JP20010244077 申请日期 2001.08.10
申请人 FUJI PHOTO FILM CO LTD 发明人 ADEGAWA YUTAKA;UENISHI KAZUYA;SHIRAKAWA KOJI
分类号 G03F7/039;C07C25/18;C07C39/15;C07C43/164;C07C309/39;C07C381/12;G03F7/004;G03F7/038;H01L21/027 主分类号 G03F7/039
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