发明名称 |
ELECTRON RAY OR X-RAY RESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive electron ray or X-ray resist composition exhibiting high sensitivity and high resolution, capable of giving excellent rectangular pattern profile and having excellent PCD and PED stability and coating property. SOLUTION: The positive electron ray or X-ray resist composition contains a compound (a1) generating an acid by electron ray or X-ray irradiation and a nitrogen-containing compound (b) having at least a specific partial structure in the molecule. |
申请公布号 |
JP2002174904(A) |
申请公布日期 |
2002.06.21 |
申请号 |
JP20010244077 |
申请日期 |
2001.08.10 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
ADEGAWA YUTAKA;UENISHI KAZUYA;SHIRAKAWA KOJI |
分类号 |
G03F7/039;C07C25/18;C07C39/15;C07C43/164;C07C309/39;C07C381/12;G03F7/004;G03F7/038;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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