SIMULTANEOUS TEST FOR INTEGRATED CIRCUIT DEVICE, USING INTER-DUT COMPARISON AND INTRA-DUT COMARISON

摘要

PROBLEM TO BE SOLVED: To provide a means for testing a plurality of integrated circuit devices at the same time. SOLUTION: This system for testing the plurality of integrated circuit(IC) devices (DUT) of testing objects is provided with an interface circuit coupled to a tester to receives a data value from a single channel or a plurality of channels so as to provide error information as to the DUT. The interface circuit transmits the data value (received from the tester via the single channel) to the plurality of DUTs. The interface circuit conducts comarison using the data value read from the DUT, and generates an error value for showing a comarison result in response thereto. The error value is returned to the tester via the same channel or a different channel.