| 摘要 |
PROBLEM TO BE SOLVED: To provide a system for testing IC that allows a simulation result in an analyzing part to be analyzed in real time, allows a microprogram inputted for setting a simulation condition to be diverted to setting of an actual testing condition, and can enhance the working efficiency for worker, by making a microprogram simulator and the analyzing part hold information about a simulation for an IC test and information about the test in common. SOLUTION: In this IC testing system, an IC testing device 150 impresses a test pattern signal to a tested IC. The microprogram simulator 14 simulates an operation of the IC testing device 150. A controller 11 controls operations of the testing device 150 and the simulator 14, and stores the informations about the operations of the device and the simulator. The controller 11 controls also the one information out of the information about the testing condition and a result of the IC testing device 150, and the simulation condition and the result of the simulator 14, based on the other information out of them.
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