发明名称 DEVICE FOR INSPECTING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a mechanism capable of pressing conductive rubber surely to an individual inspection-objective area, even when the area is narrow or the areas are adjacent to each other. SOLUTION: In this substrate inspection device wherein an area of a wiring pattern in a substrate is divided into at least two portions of the inspection- objective areas and wherein inspecting tools are pressed onto at least the one inspection-objective area R1 to inspect electrically the substrate, a lever T of which the fulcrum T2 and a power point T3 are set outside the inspection- objective area R1, and of which the application point T1 is set within the area is constituted, the inspecting tools 8, R are attached to the application point T1, the power point T3 is driven by a driving means 7, and the inspecting tools 8, R attached to the application point T1 are thereby constituted to be pressed onto the area R1.
申请公布号 JP2002174656(A) 申请公布日期 2002.06.21
申请号 JP20000373349 申请日期 2000.12.07
申请人 TAIYO KOGYO KK 发明人 HASHIZUME SHIGERU
分类号 G01R1/073;G01R1/00;G01R31/02;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R1/073
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