发明名称 DEBUGGING METHOD AND SYSTEM, AND SEMICONDUCTOR INTEGRATED DEVICE USING THE METHOD AND THE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated device capable of preventing the cost from increasing and not requiring a long manufacturing period. SOLUTION: This debugging system corrects a hardware bug and a software bug in a semiconductor integrated device. There is provided a plurality of areas 6, 7 capable of mapping a software debugging means of correcting the software bug and a hardware debugging means of correcting the hardware bug, respectively. Either of the software debugging means and the hardware debugging is selectively mapped according to the developing condition of debugging in each of the plurality of areas 6, 7 from a mapping device 20.
申请公布号 JP2002175197(A) 申请公布日期 2002.06.21
申请号 JP20000370605 申请日期 2000.12.05
申请人 NEC CORP 发明人 SAEGUSA YASUHIRO
分类号 G06F11/28;(IPC1-7):G06F11/28 主分类号 G06F11/28
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