HANDLER, AND TESTING DEVICE FOR ELECTRONIC COMPONENT

摘要

PROBLEM TO BE SOLVED: To provide a handler and a testing device that can efficiently convey and test electronic components, and that can be simplified and made small. SOLUTION: Either of a column space-variable function for electronic component holding parts 314, 323 and a line space-variable function therefor, is imparted to each of a first loader part conveyer 310 and a second loader part conveyer 320 provided with matrix-like electronic component holding parts 314, 323. Two unloader part conveyers 420, 430 provided with matrix-like electronic component holding parts 422, 433 are provided, and either of a column space-variable function for electronic component holding parts 422, 433 or a line space-variable function therefor is imparted to each of the first unloader part conveyer 420 and the second unloader part conveyer 430.