| 摘要 |
PROBLEM TO BE SOLVED: To precisely adjust the timing, using an input signal for test with a frequency the same as that when an actual testing object IC is measured. SOLUTION: This method is a method for adjusting the timing of the input signal for test supplied to each signal pad in an IC tester for conducting the input of the testing input signal to the testing object IC via the signal pads formed plurally in a measuring board and an acquirement of an output signal of the object IC with respect to the testing input signal, so as to test the testing object IC. In the method, the each testing input signal is inputted in order in an alternative way into a comparator connected to one end of a flexible signal transmission line by making the other end of the signal transmission line contact, in order, with the signal pads to measure each inversion timing when an output of the comparator is inverted, and the testing input signal is adjusted so that each inversion timing is to be a specified timing.
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