发明名称 METHOD FOR MANUFACTURING FINE PATTERN USING DOUBLE EXPOSURE
摘要 PURPOSE: A fabrication method of fine patterns is provided to easily form island-shaped fine patterns by using double exposure. CONSTITUTION: A negative photoresist is coated on an etch-object layer. The negative photoresist is firstly exposed to achieve opened regions of island shape by using a mask of horizontal line and space shape. The negative photoresist is secondly exposed by using a mask of vertical line and space shape. Then, the non-exposed negative photoresist is developed, thereby forming island-shaped fine patterns. The island-shaped fine patterns are a storage node adopted for design-rule of 0.13-0.1 micrometers.
申请公布号 KR20020046489(A) 申请公布日期 2002.06.21
申请号 KR20000076685 申请日期 2000.12.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, GWANG JUN
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
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